Investigating the stability of zinc oxide thin film transistors

By R. Cross, M. De Souza. 2006

302 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Polymers and Plastics

View Paper: https://www.semanticscholar.org/paper/32deaf7e3242cd3065854d334fb2a6c12d969d2d

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Jae Kyeong Jeong
2. Y. Mo
3. Jang Yeon Kwon
4. Hideo Hosono
5. T. Kamiya

In Materials Chemistry

1. Jae Kyeong Jeong
2. Y. Mo

In Polymers and Plastics

1. Jae Kyeong Jeong

Citations in the corpus

• Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics (2010, background): “charge trapping of accumulated electron carriers in the channel region at/near the gate dielectric and channel interface [10],”