Relation between breakdown mode and breakdown location in short channel NMOSFETs and its impact on reliability specifications

By R. Degraeve, Ben Kaczer, A. De Keersgieter, G. Groeseneken. 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167), 2001

134 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/30f072f49dba67b6a40b4bf7c3fc789c187f5634