An X-ray photoelectron spectroscopy study of the oxides of GaAs

By C. Surdu-Bob, S. Saied, J. Sullivan. 2001

166 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Surfaces, Coatings and Films

View Paper: https://www.semanticscholar.org/paper/2c74799df5f01277e5663f50cd87f088913436c4

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. G. Dalapati
2. W. Loh
3. Y. Tong
4. Hoe Keat Mun
5. B. Cho

Citations in the corpus

• Electrical and Interfacial Characterization of Atomic Layer Deposited High- $\kappa$ Gate Dielectrics on GaAs for Advanced CMOS Devices (2007, background): “a high defect density at the interface, which detrimentally affects the electrical characteristics of the devices [7].”