Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

By Kento Hoshino, D. Hong, C. Hai, J. Wager. IEEE Transactions on Electron Devices, 2009

168 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/269df290f245aea4ad0e63bd23eafd5e4bb0f362

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In Electrical and Electronic Engineering

1. John F. Conley

Citations in the corpus

• Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors (2010, background): “interaction has recently been demonstrated to have a significant impact on both bias and illumination stressing of the SBG TFTs [10], [18], [41].”