A methodology and model for the pull-in parameters of electrostatic actuators
By Yael Nemirovsky, I. Zelniker, O. Degani, G. Sarusi. 2001
251 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/22800d24cdc905eb36b69e296546b860f37242cf
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Atomic and Molecular Physics, and Optics
- Yin Zhang
- Ghader Rezazadeh
- Hamed Sadeghian
- Peter M. Osterberg
- S. Holmstrom
- Ya-pu Zhao
- Hakan Urey
- U. Baran
In Electrical and Electronic Engineering
- Yin Zhang
- Ghader Rezazadeh
- Hamed Sadeghian
- Peter M. Osterberg
- S. Holmstrom
- Ya-pu Zhao
- Hakan Urey
- U. Baran
Citations in the corpus
- Analytical Model of the DC Actuation of Electrostatic MEMS Devices With Distributed Dielectric Charging and Nonplanar Electrodes (2007, background): “[14] Y. Nemirovsky and O. Bochobza-Degani, “A methodology and model for the pull-in parameters of electrostatic actuators,” J. Microelectromech.”
- MEMS Laser Scanners: A Review (2014, background): “The pull-in problem is treated in detail in [57] and [58].”
- Analytically calculating membrane displacement and the equivalent circuit model of a circular CMUT cell (2008, background): “A general methodology for finding the pull-in point is given in [4].”
- Charge control of parallel-plate, electrostatic actuators and the tip-in instability (2003, background): “Beyond voltage pull-in, the slope and the small-signal capacitance are negative but become zero at the charge pull-in point, provided that .”
- Application of the Generalized Differential Quadrature Method to the Study of Pull-In Phenomena of MEMS Switches (2007, background): “The influence of various parameters on the pull-in voltage, such as nonlinear stiffening, fringing fields [13], trapezoidal cross section [14], residual stress [15], and axial stress, has been studied.”
- Numerical and Analytical Study on the Pull-in Instability of Micro-Structure under Electrostatic Loading (2006, background): “For electrostatic force, the expression above does not account for the fringing fields effect [ 13 ,23].”