Morphology of graphene thin film growth on SiC(0001)

By T. Ohta, F. El Gabaly, A. Bostwick, J. McChesney, K. Emtsev, A. Schmid, T. Seyller, K. Horn, Eli Rotenberg. 2007

160 citations recorded by the source corpus.

Epitaxial films of graphene on SiC(0001) are interesting from a basic physics as well as an applications-oriented point of view. Here, we study the emerging morphology of in vacuo prepared graphene films using low-energy electron microscopy (LEEM) and angle-resolved photoemission spectroscopy (ARPES). We obtain an identification of single-layer and bilayer graphene films by comparing the characteristic features in electron reflectivity spectra in LEEM to the π-band structure as revealed by ARPES. We demonstrate that LEEM serves as a tool to accurately determine the local extent of graphene layers as well as the layer thickness.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/1fe5ae08b8a91364ac8c87444e8460b782938f93

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

  1. A. Bostwick
  2. K. Emtsev
  3. T. Seyller
  4. J. McChesney
  5. Eli Rotenberg
  6. K. Horn
  7. T. Ohta
  8. Andrea C. Ferrari

In Electrical and Electronic Engineering

  1. V. Nicolosi
  2. Jonathan N. Coleman
  3. V. Scardaci
  4. Yurii K. Gun'ko
  5. A. Bostwick
  6. Andrea C. Ferrari
  7. Eli Rotenberg
  8. Mustafa Lotya

In Materials Chemistry

  1. Jonathan N. Coleman
  2. T. Seyller
  3. A. Bostwick
  4. K. Emtsev
  5. J. McChesney
  6. Eli Rotenberg
  7. T. Iakimov
  8. Andrea C. Ferrari

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