Kondo resonance in a single-molecule transistor
By W. Liang, M. Shores, M. Bockrath, Jeffrey R. Long, Hongkun Park. Nature, 2002
1,144 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/1b4167bfbaad6a5289a17594ec62fce0daedd183
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In Atomic and Molecular Physics, and Optics
- Nongjian Tao
- Mark A. Ratner
- J. V. van Ruitenbeek
- M. Di Ventra
- F. Evers
- Richard Koryt'ar
- S. Tewari
- N. Agrait
In Electrical and Electronic Engineering
- Nongjian Tao
- M. Di Ventra
- Mark A. Ratner
- J. V. van Ruitenbeek
- R. S. Williams
- Duncan R. Stewart
- F. Evers
- Richard Koryt'ar
Citations in the corpus
- Quantum properties of atomic-sized conductors (2002, methodology): “Implementing this will require new experimental approaches, possibly similar to the techniques used in two recent papers to demonstrate Kondo behavior in a single atom embedded between electrodes inside a molecular structure [489,490].”
- Nanoscale molecular-switch crossbar circuits (2003, background): “At the device level, researchers in molecular electronics have achieved significant progress recently, demonstrating tunnelling junctions [1, 2], devices with negative differential resistance [3], electrically configurable switches [4–6] and transistors made from a single carbon nanotube [7, 8] or a”
- Molecular transport junctions: vibrational effects (2006, background): “Such features may correspond to the centre of mass motion of the bridge [315] or to intramolecular vibrations [84, 245, 335, 377, 378].”
- Electron transport in molecular junctions (2006, methodology): “To create such a small separation, unconventional techniques, such as electromigratio”
- Advances and challenges in single-molecule electron transport (2019, methodology): “Low-temperature experiments us- 48 ing in-situ deposition of the metal electrodes (Kubatkin et al., 2003), experiments using electromigration (Liang et al., 2002; Osorio et al., 2007b; Park et al., 2002), or three-terminal break junctions (Perrin et al., 2013), all demonstrate the sensitivity of…”