Benchmarking SOI and bulk FinFET alternatives for PLANAR CMOS scaling succession
By T. Chiarella, L. Witters, A. Mercha, C. Kerner, M. Rakowski, C. Ortolland, L. Ragnarsson, B. Parvais, A. D. Keersgieter, S. Kubicek and 7 more. 2010
133 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/1b1a791f94ce13837af5c978d6239a27548d7714
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In Electrical and Electronic Engineering
Citations in the corpus
- Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors (2013, background): “This needs to be investigated under “real” irradiation conditions that should include measurements of SEE sensitivity of SRAMs processed using multiple-gate devices.”