Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

By V. Palermo, Matteo Palma, Paolo Samorì. 2006

415 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/1783ff8e0648d12026be26eccf8fdb18463596da

How researchers see this paper

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In Atomic and Molecular Physics, and Optics

1. Yunseok Kim
2. Bora Kim
3. Daehee Seol

Citations in the corpus

• Non-piezoelectric effects in piezoresponse force microscopy (2017, background): “Variants of SPM have been developed and extensively utilized to explore elastic,[3-5] electrical,[6-9] electrochemical,[10-12] magnetic,[13-16] and various functional properties[17-20] in the last few decades.”