Orthonormal Vector Fitting: A Robust Macromodeling Tool for Rational Approximation of Frequency Domain Responses
By Dirk Deschrijver, B. Haegeman, Tom D'haene. IEEE Transactions on Advanced Packaging, 2007
193 citations recorded by the source corpus.
Subfields: Astronomy and Astrophysics, Materials Chemistry, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/15d3bc718db5f646602c56c3bdc87549ba200ace
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Astronomy and Astrophysics
- Dirk Deschrijver
- Tom D'haene
- Bjrn Gustavsen
- Michal Mrozowski
- Daniel De Zutter
- Senior Member Ieee Stefano Grivet-Talocia
- E. Li
- Alessandro Chinea
In Materials Chemistry
- Bjrn Gustavsen
- Dirk Deschrijver
- Tom D'haene
- Yaojiang Zhang
- Xing-Chang Wei
- Joungho Kim
- M. D'amore
- E. Li
In Statistics and Probability
Citations in the corpus
- Advancements in Iterative Methods for Rational Approximation in the Frequency Domain (2007, methodology): “More implementation details are described in the OVF paper [ 19 ].”
- Macromodeling of Multiport Systems Using a Fast Implementation of the Vector Fitting Method (2008, methodology): “In the past few years, various enhancements like orthonormalization [3] and relaxation [4] have been proposed to improve the accuracy and convergence of this technique [5].”
- Delay-Based Macromodeling of Long Interconnects From Frequency-Domain Terminal Responses (2010, background): “We remark that a delayed-rational form can also be obtained by replacing the partial fraction functions in (5) with polynomials or other systems of rational basis functions (such as orthogonal rational functions [6]).”
- Progress Review of Electromagnetic Compatibility Analysis Technologies for Packages, Printed Circuit Boards, and Novel Interconnects (2010, background): “In the signal integrity community, the rational-function fitting of [53] and its variants (see e.g., [ 54 ]–[58]) are the most popular systemidentification techniques in use today.”