Optical measurement of surface topography
By Richard Leach. 2011
585 citations recorded by the source corpus.
Subfields: Computational Mechanics, Mechanical Engineering, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/15ad1363444c5f51d95c7b2bb207efd262d1d81e
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In Computational Mechanics
In Mechanical Engineering
Citations in the corpus
- Surface texture metrology for metal additive manufacturing: a review (2016, background): “ters limited in terms of the information they can provide relating to part functionality and detailed process feedback [98,99].”
- Characterisation of Areal Surface Texture (2013, methodology): “J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam Leach RK (2011) Optical measurement of surface topography. Springer, Berlin Leach RK (2001) The measurement of surface texture using stylus instruments. NPL good practice guide N”
- Review of in-situ process monitoring and in-situ metrology for metal additive manufacturing (2016, background): “However, there are two distinct classes of instrument: (a) those thatmeasure over large areas (metres squared)with tens to hundreds ofmicrometres spatial resolution (for example, fringe projection, photogrammetry and Moiré interferometry) [121], and (b) those that measure over small areas (up to a f”
- Principles of interference microscopy for the measurement of surface topography (2015, unknown): “As is the case with companion techniques, such as focus variation [53], structured light [18], and confocal microscopy [17], interference microscopy offers rapid, non-contact operation with high data density.”