Trap-assisted tunneling in high permittivity gate dielectric stacks

By Michel Houssa, M. Tuominen, M. Naili, V. Afanas’ev, A. Stesmans, S. Haukka, M. Heyns. 2000

338 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/1540a8f99d009804c59660d380f748cf276bb864