Comparison of calibration methods for atomic-force microscopy cantilevers

By N. Burnham, X. Chen, C. Hodges, G. Matei, E. Thoreson, C. Roberts, M. C. Davies, S. Tendler. 2002

456 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/12f0d9ba4e490824f14c52b5888c8d74f0a80bb4

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Y. Dufrêne
2. D. Müller
3. Attila Nagy
4. K. Neuman

In Electrical and Electronic Engineering

1. Y. Dufrêne

Citations in the corpus

• Detection and localization of single molecular recognition events using atomic force microscopy (2006, background): “Notably, the actual spring constants may differ substantially from values quoted by the manufacturer, meaning researchers must determine spring constants experimentally to get accurate knowledge of the measured forces (see ref”