A buckling-based metrology for measuring the elastic moduli of polymeric thin films

By C. Stafford, C. Harrison, K. Beers, A. Karim, E. Amis, M. Vanlandingham, Ho-Cheol Kim, W. Volksen, Robert D. Miller, E. Simonyi. Nature Materials, 2004

1,256 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Mechanical Engineering

View Paper: https://www.semanticscholar.org/paper/0a00b2f99e8799651128717feff04924a3840537

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In Atomic and Molecular Physics, and Optics

In Biomedical Engineering

In Mechanical Engineering

Citations in the corpus

Polymer Nanocomposites: The “Nano” Effect on Mechanical Properties (2007, background): “polymer nanocomposite) onto a thick, crosslinked elastomer substrate.(36,37) The elastomer substrate is subsequently strained, thus transferring strain to the sample film if good adhesion is maintained.”
Localized ridge wrinkling of stiff films on compliant substrates (2012, neutral): “…ranging from fabricating surfaces with controlled patterns with unique wetting, optical and acoustic properties, and for measuring the mechanical properties of materials to the design of flexible electronics (Bowden et al., 1998; Stafford et al., 2004; Lacour et al.; Khang et al., 2006).”
Buckling of a stiff thin film on a compliant substrate in large deformation (2008, methodology): “…systems (e.g., Huang and Suo, 2002; Harrison et al., 2004; Huang, 2005; Huang et al., 2005; Chen and Hutchinson, 2004; Lacour et al., 2004, 2006; Stafford et al., 2004, 2006; Khang et al., 2006; Sun et al., 2006a,b; Choi et al., 2007; Jiang et al., 2007) because 0020-7683/$ - see front matter…”