Sharpening high resolution information in single particle electron cryomicroscopy.
By José-Jesús Fernández, Daniel Luque, J. R. Castón, J. Carrascosa. 2008
122 citations recorded by the source corpus.
How researchers see this paper
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- Pavel V. Afonine
- D. Liebschner
- Paul D. Adams
- T. C. Terwilliger
- T. Croll
- G. Bunkoczi
- Nigel W. Moriarty
- Randy J. Read
Citations in the corpus
- Macromolecular structure determination using X-rays, neutrons and electrons: recent developments in Phenix (2019, background): “However, sharpening can reveal the high-resolution details concealed in a cryo-EM map (Rosenthal & Henderson, 2003; Fernández et al., 2008).”
- Blind deconvolution in scientific imaging & computational photography (2011, methodology): “For comparison we also show the results of B-factor sharpening, where we used the implementation of Fernández et al. (2008). The resulting density is of poor quality, which is probably due to unwanted noise amplification.”
- One number does not fit all: mapping local variations in resolution in cryo-EM reconstructions (2013, methodology): “Furthermore, the same information can be used to determine the equivalent B-factors and to sharpen the reconstruction in a localized manner, following available methods (Fernandez et al., 2008; Rosenthal and Henderson, 2003) that use resolution curves to determine optimum parameters.”