Physics-of-Failure Lifetime Prediction Models for Wire Bond Interconnects in Power Electronic Modules

By Pearl A. Agyakwa, C. Mark Johnson. IEEE transactions on device and materials reliability, 2013

173 citations recorded by the source corpus.

This paper presents a review of the commonly adopted physics-of-failure-based life prediction models for wire bond interconnects in power electronic modules. In the discussed models, lifetime is generally accounted for by loading temperature extremes alone. The influence of the time spent at temperature on bond wear-out behavior and damage removal phenomena resulting from thermally activated processes is not addressed. The phenomenological considerations based on some unusual observations highlight the need for new approaches to wire bond life prediction models and thus motivate the proposal of a new time-domain damage-based crack propagation model.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0a126b0515ff8b565bfa395a72ce51f9f99a56fe

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

  1. Frede Blaabjerg
  2. Huai Wang
  3. U. Choi
  4. Marco Liserre
  5. Kyo-Beum Lee
  6. Yihua Hu
  7. Wenping Cao
  8. Xiongfei Wang

Citations in the corpus