Numerical modeling of highly doped Si:P emitters based on Fermi–Dirac statistics and self-consistent material parameters

By P. Altermatt, J. Schumacher, A. Cuevas, M. Kerr, Stefan W. Glunz, R. King, G. Heiser, A. Schenk. 2002

181 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/0906a403e778b44e150889c4c399eae023bf5d8c