A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

By F. Giessibl. 2001

266 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/0888d90eb1ba18e0722da88312e928431ad9934c

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In Atomic and Molecular Physics, and Optics

1. F. Giessibl

In Biomedical Engineering

1. F. Giessibl

Citations in the corpus

• Advances in atomic force microscopy (2003, methodology): “Shortly after the first demonstration of true atomic resolution of Si by AFM, Kitamura and Iwatsuki (1995); Güthner (1996); Lüthi et al.”