Performance and ruggedness of 1200V SiC — Trench — MOSFET

By D. Peters, R. Siemieniec, Thomas Aichinger, Thomas Basler, R. Esteve, W. Bergner, Daniel Kueck. International Symposium on Power Semiconductor Devices and IC's, 2017

133 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0853155f8e45c8e56629c558731ed871c9c21cbe