A mechanical microscope: High speed atomic force microscopy

By A. Humphris, M. Miles, J. Hobbs. 2005

319 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/06376d6d53d87e766f8c80c8dbcd26d293c03693

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Philipp J. Thurner
2. Georg Schitter
3. Daniel J. Muller
4. Paul K. Hansma
5. Kimberly L. Turner
6. Christian A. Bippes

In Electrical and Electronic Engineering

1. Daniel J. Muller
2. K. Åström
3. Kimberly L. Turner
4. Christian A. Bippes
5. Marek Miskowicz

Citations in the corpus

• Design and Modeling of a High-Speed AFM-Scanner (2007, background): “Some efforts have been made to speed up imaging by using smaller and faster force sensors [10], [11] and directly actuated cantilevers [12], [13], by improving the mechanical design of the scanner [14]–[16], by exploiting alternative scanning methods [17], and by utilizing advanced control methods…”
• High-resolution atomic force microscopy and spectroscopy of native membrane proteins (2011, methodology): “The proposed scanner designs include piezo stacks [39], high resonance flexure piezo scanners [40, 41] and quartz tuning forks [42].”