Accuracy and resolution limits of Kelvin probe force microscopy

By U. Zerweck, C. Loppacher, T. Otto, S. Grafström, L. Eng. 2005

397 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering

View Paper: https://www.semanticscholar.org/paper/05b7e1d01f5af3a371361dae486dea9d41c44461

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. J. A. D. Silva
2. J. Gonzalez‐Julian
3. M. Bram
4. O. Guillon
5. Kerstin Neuhaus
6. V. Tsukruk
7. A. Laptev
8. Srikanth Singamaneni

In Biomedical Engineering

1. J. Gonzalez‐Julian
2. V. Tsukruk

Citations in the corpus

• Probing Soft Matter with the Atomic Force Microscopies: Imaging and Force Spectroscopy (2010, background): “167 In the initial stages, it was believed that the tip–sample separation and tip radius are limiting factors of the resolution attained in KPFM measurements.”
• Water on graphene: review of recent progress (2018, neutral): “As FM-KPFM is a force gradient technique, a high spatial resolution of <20 nm can be achieved, which is limited only by the tip apex diameter [121, 122].”
• Unveiling the mechanisms of cold sintering of ZnO at 250 °C by varying applied stress and characterizing grain boundaries by Kelvin Probe Force Microscopy (2018, background): “On the other hand, Kelvin Probe Force Microscopy (KPFM) is a scanning probe technique that enables the observation of the topography of a sample in combination with the surface potential at a high lateral resolution [32][33][34], leading to a mapping of the local changes in defect”