Probing Soft Matter with the Atomic Force Microscopies: Imaging and Force Spectroscopy

By M. McConney, Srikanth Singamaneni, V. Tsukruk. 2010

224 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/e41bca76b5993db9bd60c42db40e1455fc76252f