Determining the material structure of microcrystalline silicon from Raman spectra

By C. Smit, Van Swaaij, H. Donker, A. Petit, W. Kessels, Van de Sanden. 2003

374 citations recorded by the source corpus.

Subfields: Ceramics and Composites, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/04e8b553d20a2d6a62ac2c1cb8d09c728162bb9e