Metrological large range scanning probe microscope

By G. Dai, F. Pohlenz, H. Danzebrink, Min Xu, K. Hasche, G. Wilkening. 2004

168 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/0141cd0759621a8b2661a6601bf719f1bb58328a

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Atomic and Molecular Physics, and Optics

1. Kam K. Leang
2. Santosh Devasia
3. Shorya Awtar
4. G. Parmar
5. Andrew J. Fleming
6. Chun-Yi Su
7. S. O. Reza Moheimani
8. Guoying Gu

In Biomedical Engineering

1. Kam K. Leang
2. Shorya Awtar
3. Santosh Devasia
4. G. Parmar
5. Micky Rakotondrabe

In Electrical and Electronic Engineering

1. Santosh Devasia
2. Kam K. Leang

Citations in the corpus

• Design of hysteresis-compensating iterative learning control for piezo-positioners: Application to atomic force microscopes (2006, background): “Furthermore, similar positioningerror problems due to hysteresis arise in other AFM-based applications such as high-density data storage [3] and nanometrology [8].”
• Design of a Large Range XY Nanopositioning System (2010, background): “These attributes help achieve 10mm × 10mm motion range in the proposed nanopositioning system.”