Yanfen Shang
Statistics and Probability · 2011–2013
A researcher in the Science corpus: 2 papers; trusts 22 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Statistics and Probability — 22 citations into it
- Control and Systems Engineering — 7 citations into it
Whom Yanfen Shang trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
- Eric R. Ziegel
- Changliang Zou
- Youngjo Lee
- William H. Woodall
- Willis A. Jensen
- Wei Jiang
- R. Chappell
- Peihua Qiu
- Marion R. Reynolds
- Douglas M. Hawkins
Papers from Yanfen Shang's perspective
Ordered by how strongly the researchers Yanfen Shang trusts endorse each paper. Same corpus, a different order for every researcher.
- Using Control Charts to Monitor Process and Product Quality Profiles
- Phase I Analysis of Linear Profiles With Calibration Applications (Technometrics)
- On the Monitoring of Linear Profiles
- Generalized Linear Models
- Current research on profile monitoring
- Effects of Parameter Estimation on Control Chart Properties: A Literature Review
- Double hierarchical generalized linear models (with discussion)
- A Self-Starting Control Chart for Linear Profiles
- Generalized Linear Models with Random Effects: Unified Analysis via H-likelihood
- A change point method for linear profile data (Quality and Reliability Engineering International)
Their papers
- Profile Monitoring with Binary Data and Random Predictors (2011) — 78 citations
- Statistical process control for multistage processes with binary outputs (2013) — 48 citations