Young-Joon Kim
Artificial Intelligence · with Kim · 2017
A researcher in the Science corpus: 1 paper; trusts 9 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Artificial Intelligence — 7 citations into it
- Computer Vision and Pattern Recognition — 5 citations into it
Whom Young-Joon Kim trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
- Geoffrey E. Hinton
- Alex Krizhevsky
- Yoshua Bengio
- Yann LeCun
- Ilya Sutskever
- Pascal Vincent
- Nitish Srivastava
- L. Eon Bottou
- Hugo Larochelle
- Ruslan Salakhutdinov
Who trusts Young-Joon Kim overall
Papers from Young-Joon Kim's perspective
Ordered by how strongly the researchers Young-Joon Kim trusts endorse each paper. Same corpus, a different order for every researcher.
- ImageNet classification with deep convolutional neural networks
- Gradient-based learning applied to document recognition
- Deep Residual Learning for Image Recognition (Computer Vision and Pattern Recognition)
- Adam: A Method for Stochastic Optimization (International Conference on Learning Representations)
- Long Short-Term Memory
- Attention is All you Need (Neural Information Processing Systems)
- Learning Multiple Layers of Features from Tiny Images
- ImageNet: A large-scale hierarchical image database
- Dropout: a simple way to prevent neural networks from overfitting
- Batch Normalization: Accelerating Deep Network Training by Reducing Internal Covariate Shift (International Conference on Machine Learning)
Their papers
- A Deep Learning Model for Robust Wafer Fault Monitoring With Sensor Measurement Noise (2017) — 98 citations