Learning from mistakes: a comprehensive study on real world concurrency bug characteristics

By Shan Lu, Soyeon Park, Eunsoo Seo, Yuanyuan Zhou. International Conference on Architectural Support for Programming Languages and Operating Systems, 2008

1,014 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture, Software

View Paper: https://www.semanticscholar.org/paper/ffabe1365d21be3c5847e4b126a3357fe86aa5dd

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

  1. Shan Lu
  2. Bowen Zhou
  3. Yuanyuan Zhou
  4. Li Zhang
  5. Fei Wang
  6. Seyit Ahmet Camtepe
  7. Soyeon Park
  8. Ji Liu

In Hardware and Architecture

  1. Shan Lu
  2. Sheng Wen
  3. Yuanyuan Zhou
  4. Rüdiger Kapitza
  5. Peter R. Pietzuch
  6. Anil Kurmus
  7. Soyeon Park
  8. Nico Weichbrodt

In Software

  1. Shan Lu
  2. Sheng Wen
  3. Yuanyuan Zhou
  4. Darko Marinov
  5. Rüdiger Kapitza
  6. Peter R. Pietzuch
  7. Seyit Ahmet Camtepe
  8. Anil Kurmus

Citations in the corpus