Reliability of various size oxide aperture VCSELs

By B. Hawkins, R. Hawthorne, James K. Guenter, Jim A. Tatum, J. Biard. Electronic Components and Technology Conference, 2002

148 citations recorded by the source corpus.

Subfields: Computational Mechanics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/fe2d18adfe70cda43a80daa5abef8c839407dff2

How researchers see this paper

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In Electrical and Electronic Engineering

1. Anders Larsson
2. Petter Westbergh
3. Å. Haglund
4. Johan S. Gustavsson

Citations in the corpus

• Advances in VCSELs for Communication and Sensing (2010, background): “Finally, it should be noted that many of the high-speed GaAs-based VCSELs operate at a current density approaching 10 kA/cm2 , which is close to the current density of today’s very reliable 10 Gb/s VCSELs [117].”