High temperature stability in lanthanum and zirconia-based gate dielectrics

By J. Maria, D. Wicaksana, A. Kingon, B. Busch, H. Schulte, Eric L. Garfunkel, T. Gustafsson. 2001

189 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/fdb6b70369e22ddbf5241b101511b755cf602286