A Test Generation Strategy for Pairwise Testing
By K. Tai, Yu Lei. IEEE Trans. Software Eng., 2002
400 citations recorded by the source corpus.
Subfields: Computational Theory and Mathematics, Hardware and Architecture, Software
View Paper: https://www.semanticscholar.org/paper/fc8b516c6f37b1be737891cdaedf73348a0400aa
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Computational Theory and Mathematics
- Myra B. Cohen
- Charles J. Colbourn
- Matthew B. Dwyer
- Jiangfan Shi
- Mark Harman
- Edmund Kieran Burke
- Phil McMinn
- Saswat Anand
In Hardware and Architecture
- Myra B. Cohen
- Jeff Offutt
- Charles J. Colbourn
- Matthew B. Dwyer
- Jiangfan Shi
- Mark Harman
- Phil McMinn
- Changhai Nie
In Software
- Mark Harman
- Phil McMinn
- Myra B. Cohen
- Matthew B. Dwyer
- Jiangfan Shi
- Charles J. Colbourn
- Jeff Offutt
- Shin Yoo
Citations in the corpus
- Software fault interactions and implications for software testing (2004, background): “Many more empirical studies of other classes of software are needed to evaluate the applicability of combinatorial testing for other classes of systems.”
- An orchestrated survey of methodologies for automated software test case generation (2013, methodology): “A second class of greedy algorithms are of the form used in the In Parameter Order Algorithm (Tai and Lei, 2002; Lei et al., 2008).”
- Constructing Interaction Test Suites for Highly-Configurable Systems in the Presence of Constraints: A Greedy Approach (2008, methodology): “A different type of greedy algorithm is the In Parameter Order (IPO) algorithm [17].”
- Combination testing strategies: a survey (2005, background): “In Parameter Order (IPO) For a system with two or more parameters, the in-parameter-order (IPO) combination strategy [18, 24, 27] generates a test suite that satisfies pair-wise coverage for the values of the first two parameters.”
- Combinatorial aspects of covering arrays (2006, background): “In terms of practical application, the variant most studied is a scheme that adjoins both rows and columns in a greedy fashion, called In-ParameterOrder (IPO) [123], [140].”
- IPOG: A General Strategy for T-Way Software Testing (2007, methodology): “In [13][16], we proposed the IPO strategy, which builds a pairwise test set for the first two parameters, extends the test set to cover the first three parameters, and continues to extend the test set until it builds a pairwise test set for all the parameters.”