Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4−xNdxTi3O12 films
By Ashish Garg, Zoe H. Barber, M. Dawber, J. F. Scott, A. Snedden, Philip Lightfoot. 2003
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Epitaxial (001)-, (118)-, and (104)-oriented Nd-doped Bi4Ti3O12 films have been grown by pulsed-laser deposition from a Bi4−xNdxTi3O12 (x=0.85) target on SrRuO3 coated single-crystal (100)-, (110)-, and (111)-oriented SrTiO3 substrates, respectively. X-ray diffraction illustrated a unique epitaxial relationship between film and substrate for all orientations. We observed a strong dependence of ferroelectric properties on the film orientation, with no ferroelectric activity in an (001)-oriented film; a remanent polarization 2Pr of 12 μC/cm2 and coercive field Ec of 120 kV/cm in a (118)-oriented film; and 2Pr=40 μC/cm2, Ec=50 kV/cm in a (104)-oriented film. The lack of ferroelectric activity along the c-axis is consistent with the orthorhombic nature of the crystal structure of the bulk material, as determined by powder neutron diffraction.
Subfields: Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Materials Chemistry
View Paper: https://www.semanticscholar.org/paper/fa8b6b177cd75b26a88ae7f91965153893e9b825
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Citations in the corpus
- Physics of thin-film ferroelectric oxides (2005, background): “…et al., 2002); unless there is an unusually high polarizability for the non-perovskite layers, or a strong competing contribution to the energy due, for example, to the interfaces to help stabilize a high c polarization, other reasons for the observations need to be considered (Garg et al., 2003).”