Toughness measurement of thin films: a critical review

By Sam Zhang, Deen Sun, Y. Fu, H. Du. 2005

387 citations recorded by the source corpus.

Subfields: Ceramics and Composites, Electrical and Electronic Engineering, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/f94266f83b79e92257b8ac62b67b38a8af778bde