Sub-bandgap defect states in polycrystalline hafnium oxide and their suppression by admixture of silicon

By N. Nguyen, A. Davydov, D. Chandler-Horowitz, M. Frank. 2005

147 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f8cc2ce1ef35362e53a0eb11f4c5be28d1c982fd

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Citations in the corpus

• Trapping, self-trapping and the polaron family (2007, background): “Neither the conduction band maximum nor the valence band minimum eigenvalues show any significant coupling to the LO phonon at ∼770–780 cm−1 (Nguyen et al 2005).”