Tests for location-scale families based on the empirical characteristic function
By T. W. Epps. 2005
47 citations recorded by the source corpus.
Subfields: Artificial Intelligence, Statistics and Probability
View Paper: https://www.semanticscholar.org/paper/f6fcdfd81818244ef7ab4fda84004ed059b62976
How researchers see this paper
The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.
In Artificial Intelligence
- Anne Leucht
- Simos G. Meintanis
- Michael H. Neumann
- Jan W. H. Swanepoel
- Konstantinos Fokianos
- E. Rio
- H. Muhammed
- Richard A. Davis
In Statistics and Probability
- Anne Leucht
- Michael H. Neumann
- Jan W. H. Swanepoel
- Simos G. Meintanis
- Arthur Gretton
- Kacper P. Chwialkowski
- Konstantinos Fokianos
- Norbert Henze
Citations in the corpus
- Consistency of general bootstrap methods for degenerate U-type and V-type statistics (2009, background): “Epps [23] proposed again a generalization to general location–scale families and worked out simple expressions for the test statistic in several cases.”
- Bootstrap goodness-of-fit tests with estimated parameters based on empirical transforms (2007, background): “This approach is in fact pretty much straightforward in location–scale families (see for instance Epps, 2005, for a unified treatment), but the presence of an extra shape parameter necessi- tates the use of the parametric bootstrap, and the consequent justification of this procedure Ac ce pt ed m…”