Survey of Test Vector Compression Techniques

By N. Touba. IEEE Design & Test of Computers, 2006

432 citations recorded by the source corpus.

Subfields: Control and Systems Engineering, Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/f65a70d90c0b0fa5e5ae7086672c6dbad28adfc6