Measuring the specific contact resistance of contacts to semiconductor nanowires

By S. Mohney, Yanfeng Wang, Marco A. Cabassi, K. Lew, S. Dey, J. Redwing, T. Mayer. 2005

142 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Biomedical Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f4d26b361a4680576c4f4c9638a2b70868fe5bf9