Texture analysis with the new HIPPO TOF diffractometer

By H. Wenk, Luca Lutterotti, Sven C. Vogel. 2003

340 citations recorded by the source corpus.

Subfields: Geophysics, Materials Chemistry, Radiation

View Paper: https://www.semanticscholar.org/paper/f4b5a1201f7b223a7017e5cc72812ef7255eef38