Fault Diagnosis and Reconfiguration for Multilevel Inverter Drive Using AI-Based Techniques
By S. Khomfoi, Leon M. Tolbert. IEEE transactions on industrial electronics (1982. Print), 2007
303 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/f425c79c1371f9d9346918c284cc851b75d7a7d8
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In Electrical and Electronic Engineering
- José Raúl Rodríguez Rodríguez
- Josep Pou
- Thierry A. Meynard
- Wojciech Sleszynski
- Salvador Ceballos
- Janusz Nieznanski
- Behrooz Mirafzal
- Artur Cichowski
Citations in the corpus
- Survey on Fault Operation on Multilevel Inverters (2010, background): “2 ) Use of AI Algorithms: In [6], the use of artificial intelligence (AI) algorithms, due to their ability to recognize patterns, is proposed to detect and identify faults in a CM inverter.”
- Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents (2009, methodology): “Whereas voltage measurements are usually avoided, some papers address diagnostics based on measured voltages [5], [6], [9], [30].”
- Survey of Fault-Tolerance Techniques for Three-Phase Voltage Source Inverters (2014, background): “For example, if the transistor in S1 fails as an open circuit, S2 must be turned “on” while S3 and S4 are turned “off” to bypass the faulty cell [37].”