Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes

By T. Bhandakkar, Huajian Gao. 2010

212 citations recorded by the source corpus.

Subfields: Automotive Engineering, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f3859561785bb3412c5093131b871a38306a49eb

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Automotive Engineering

  1. A. Bower
  2. Pradeep R. Guduru
  3. Siva P. V. Nadimpalli
  4. Giovanna Bucci
  5. Yi Cui
  6. V. Sethuraman
  7. W. Nix
  8. J. Choi

In Electrical and Electronic Engineering

  1. Yi Cui
  2. A. Bower
  3. Pradeep R. Guduru
  4. J. Choi
  5. V. Sethuraman
  6. Siva P. V. Nadimpalli
  7. Giovanna Bucci
  8. I. Ryu

Citations in the corpus