Suppression of Dynamic On-Resistance Increase and Gate Charge Measurements in High-Voltage GaN-HEMTs With Optimized Field-Plate Structure

By W. Saito, T. Nitta, Y. Kakiuchi, Yasunobu Saito, K. Tsuda, I. Omura, M. Yamaguchi. IEEE Transactions on Electron Devices, 2007

213 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f30110159e59366c6d6ba8f1212c7aa0e0d07191