Ultrafast carrier relaxation in radiation-damaged silicon on sapphire studied by optical-pump–terahertz-probe experiments

By K. P. H. Lui, F. Hegmann. 2001

139 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f277d73b0038a5b469c7f1330a71a23692fa941d