Fluctuation limits & scaling opportunities for CMOS SRAM cells

By A. Bhavnagarwala, Stephen Kosonocky, C. Radens, Kevin Stawiasz, Randy Mann, Qiuyi Ye, Ken Chin. IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 2005

198 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/f262ea6a37ec116a7a193a9b7f3edeedc61a90e8