Which concurrent error detection scheme to choose ?

By Subhasish G. Mitra, Edward Joseph McCluskey Jr.. Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159), 2000

302 citations recorded by the source corpus.

Subfields: Computer Networks and Communications, Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/f139be6b41dffbade57560d4c6815ddcf223a5b1