Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits.

By T. Kiwa, Masayoshi Tonouchi, M. Yamashita, K. Kawase. 2003

180 citations recorded by the source corpus.

Subfields: Ecology, Evolution, Behavior and Systematics, Electrical and Electronic Engineering, Immunology and Allergy

View Paper: https://www.semanticscholar.org/paper/ee9420c670529bb211a4b2941133a7550c8ece89

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Ecology, Evolution, Behavior and Systematics

1. Daniel M. Mittleman
2. A. Adam

In Electrical and Electronic Engineering

1. A. Adam
2. Daniel M. Mittleman
3. Wai Lam Chan
4. Jason A. Deibel
5. Sushil Kumar
6. A. Markelz
7. Tadao Nagatsuma

In Immunology and Allergy

1. A. Adam

Citations in the corpus

• Imaging with terahertz radiation (2007, background): “Another recent example is from Kawase and co-workers, who have developed a laser terahertz emission microscope (LTEM) for studying the electric field distributions in integrated circuits (see figure 39) [201, 202].”
• Review of Terahertz Tomography Techniques (2014, methodology): “imaging [80] dark-field imaging [81], single-pixel imaging [82–84] and compressive imaging technique[85], real time imaging [86], time reversal imaging [87], terahertz microscope [88, 89] and interferometric imaging [90, 91].”
• Review of Near-Field Terahertz Measurement Methods and Their Applications (2011, methodology): “Electrical failures in semiconductors Following earlier work on integrated circuits [114], Yamashita et al.”