Fatigue in thin films: lifetime and damage formation
By Oliver Kraft, R. Schwaiger, P. Wellner. 2001
177 citations recorded by the source corpus.
Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Mechanics of Materials
View Paper: https://www.semanticscholar.org/paper/ee8714c8ee7274f79fa13b9ab080e6a137cb5402
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In Mechanics of Materials
Citations in the corpus
- Cyclic deformation of polycrystalline Cu films (2003, background): “For each cycle, the mechanical energy loss was recorded, which is associated with the work of plastic deformation in the thin film and decreases significantly when the film is fatigued (Kraft et al. 2001).”