Charge storage and interface states effects in Si-nanocrystal memory obtained using low-energy Si+ implantation and annealing

By E. Kapetanakis, P. Normand, D. Tsoukalas, K. Beltsios, J. Stoemenos, S. Zhang, J. Berg. 2000

133 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/ee81e30cd5bfe002fea479a385e800a35dc1e06f