Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events

By R. Kanj, R. Joshi, S. Nassif. 2006 43rd ACM/IEEE Design Automation Conference, 2006

367 citations recorded by the source corpus.

Subfields: Condensed Matter Physics, Electrical and Electronic Engineering, Materials Chemistry

View Paper: https://www.semanticscholar.org/paper/ed14bd25a2df8a3130f896d8dbf8afa29236ecfb