Determination of residual stresses by X-ray diffraction

By Michael E. Fitzpatrick, A. T. Fry, P. Holdway, F. Kandil, J. Shackleton, L. Suominen. 2005

309 citations recorded by the source corpus.

View Paper: https://www.semanticscholar.org/paper/ecbaba17e7e95806ab701cefab1fd50781adc2b6

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1. Xu Song
2. S. Feih
3. Chen-Nan Sun
4. Wei Zhai
5. Jun Wei
6. Feng Li
7. Rajarshi Maiti
8. Yangzhan Yang

Citations in the corpus

• Advances in additive manufacturing process simulation: Residual stresses and distortion predictions in complex metallic components (2020, methodology): “The standard Sin(2)Ψmethod [22] was employedwith peak (420) selected as the reference lattice plane.”