Influence of surface and grain-boundary scattering on the resistivity of copper in reduced dimensions

By W. Wu, S. Brongersma, M. V. Hove, K. Maex. 2004

213 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

View Paper: https://www.semanticscholar.org/paper/ec2e839431174fb428949a6423a5605186aee031