Interpretation of X-ray photoelectron spectra of carbon-nitride thin films: New insights from in situ XPS

By N. Hellgren, R. Haasch, Susann Schmidt, L. Hultman, I. Petrov. 2016

246 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials

View Paper: https://www.semanticscholar.org/paper/eb6469fa65494e3c57b90306bbf404c965a5452a